Carl Zeiss Next Generation Analytical Electron Microscopes Launched

Normally, when we go to the hospital or medical centers, it would take time for us to get the results from the specimens we provide for testing. Soliciting these samples is the easy part. It is the matter of reading and analyzing them that is normally the longer period. But now, waiting time for results may soon be over as Carl Zeiss unveils a next generation microscope that combine high resolution imaging with analysis for the first time.
“Customers have a need for more than just high resolution images of their samples,” Dr. Dirk Stenkamp, Member of the Board at Carl Zeiss SMT explains. “With unique analytical capabilities our instruments provide maximum information with maximum insight.”
The device to make it all happen is the MERLIN FE SEM. Now, people seeking consistent test results can do so for this new two-in-one machine. The system supports the user with a wide range of detailed solutions for tasks that could not be adequately performed in the past.
The foundation for this achievement has been laid by the Carl Zeiss “Complete Detection System”. This consists of the in-lens SE detector for surface imaging, the in-lens EsB detector for material contrast and the AsB detector for widely dispersed backscattered electrons.
(Source) Press
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